| 标题 |
Preferential sputtering observed in Auger electron spectroscopy sputter depth profiling of AlAs/GaAs superlattice using low‐energy ions |
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| DOI | |
| 其它 |
期刊:Surface and Interface Analysis 作者:Y. Mizuhara; T. Bungo; T. Nagatomi; Y. Takai 出版日期:2005-01-31 |
| 求助人 | |
| 下载 |
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(2025-6-4)