材料科学
二硫化钼
对称(几何)
石墨烯
半导体
薄脆饼
图像拼接
纳米技术
光电子学
结晶学
光学
化学
物理
复合材料
几何学
数学
作者
Honglin Chen,Shan Jiang,Lingli Huang,Ping Man,Qingming Deng,Jiong Zhao,Thuc Hue Ly
出处
期刊:ACS Nano
[American Chemical Society]
日期:2024-12-11
卷期号:18 (51): 35029-35038
被引量:18
标识
DOI:10.1021/acsnano.4c14162
摘要
The large-scale preparation of two-dimensional (2D) materials is pivotal in unlocking their extensive potential for next-generation semiconductor device applications. Wafer-scale single crystals of a high-symmetry 2D material (e.g., graphene and molybdenum disulfide) can be achieved by seamlessly stitching the aligned domains. However, achieving the alignment of low-symmetry 2D materials remains a great challenge and is rarely reported. Rhenium disulfide (ReS 2 ), one of the low-symmetry 2D materials, shows considerable promise for optoelectronics, especially polarization-sensitive applications. Here, we report large-area chemical vapor deposition synthesis of highly oriented, low-symmetry monolayer ReS 2 flakes on a high-symmetry Au(111) surface, followed by seamless stitching into a centimeter-scale continuous 2D film. Cross-sectional scanning transmission electron microscopy reveals that the aligned monolayer ReS 2 flakes are guided by step edges on Au(111) surfaces along the [011̅] direction. Additionally, 2D ReS 2 can flatten Au surfaces during its growth through surface step bunching. The growth of the ReS 2 monolayer demonstrates its ability to extend across Au surface steps and facets. Thus, we have established a reliable and robust synthesis route that accommodates different surface roughness conditions. The aligned and scalable film growth of low-symmetry 2D ReS 2 significantly contributes to the in-depth understanding of epitaxial growth mechanisms for low-symmetry 2D materials, holding promise for advancing their future applications.
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