神经形态工程学
长时程增强
材料科学
电阻随机存取存储器
记忆电阻器
锡
光电子学
人工神经网络
突触
电压
计算机科学
生物医学工程
电子工程
神经科学
人工智能
电气工程
化学
工程类
心理学
生物化学
受体
冶金
作者
Umesh Gawai,Chien‐Hung Wu,Kow‐Ming Chang
标识
DOI:10.1021/acsaelm.3c00444
摘要
In this study, an interfacial switching (IFS)-based bioinspired TiN/AlON/TaON/Pt resistive random-access memory (RRAM) device was fabricated to investigate its conduction mechanism and synaptic behavior for neuromorphic computing. This device exhibited excellent dc endurance over at least 10000 cycles, an ac pulse endurance of 1 M, and long-term retention (106 s) at 150 °C with no degradation. The device also showed multilevel characteristics. The RESET stop voltage of the device varied from −0.9 to −1.3 V. The device was highly stable over 250 potentiation and depression cycles, which are crucial in Hopfield neural network (HNN)-based neuromorphic systems. High nonlinearity (1.13 for potentiation and −1.75 for depression) was achieved using the device potentiation and depression functions. Experimental potentiation and depression data were used to train an HNN based on the fabricated device to recognize an input image of 28 × 28 pixels that contained 784 synapses. The HNN had a training accuracy of higher than 93% in 22 iterations. The experimental results indicate that the fabricated IFS-based TiN/AlON/TaON/Pt RRAM device is highly suitable for neuromorphic devices that mimic synaptic characteristics for neuromorphic systems.
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