平版印刷术
计算机科学
可扩展性
过程(计算)
计算机工程
计算光刻
人工神经网络
深度学习
卷积(计算机科学)
领域(数学分析)
计算科学
计算机体系结构
卷积神经网络
人工智能
抵抗
多重图案
图层(电子)
纳米技术
材料科学
数学分析
操作系统
数据库
光电子学
数学
作者
Haoyu Yang,Haoxing Ren
标识
DOI:10.1145/3566097.3568361
摘要
Computational lithography is a critical research area for the continued scaling of semiconductor manufacturing process technology by enhancing silicon printability via numerical computing methods. Today's solutions for these problems are primarily CPU-based and require many thousands of CPUs running for days to tape out a modern chip. We seek AI/GPU-assisted solutions for the two problems, aiming at improving both runtime and quality. Prior academic research has proposed using machine learning for lithography modeling and mask optimization, typically represented as image-to-image mapping problems, where convolution layer backboned UNets and ResNets are applied. However, due to the lack of domain knowledge integrated into the framework designs, these solutions have been limited by their application scenarios or performance. Our method aims to tackle the limitations of such previous CNN-based solutions by introducing lithography bias into the neural network design, yielding a much more efficient model design and significant performance improvements.
科研通智能强力驱动
Strongly Powered by AbleSci AI