Mixed-level technique for the junction solar cellsimulation with equivalent circuit model
作者
Tony Wong
出处
期刊:Electronics Letters [Institution of Engineering and Technology] 日期:1996-02-01卷期号:32 (3): 252-253
标识
DOI:10.1049/el:19960135
摘要
The analysis of the solar cell characteristics, including series resistance using a mixed-level simulation technique, is presented. Device analysis is carried out by the transmission line equivalent circuit approach and the effect of series resistance to the device is obtained using circuit-level simulation.