蒙特卡罗方法
电子
统计物理学
材料科学
工程物理
计算物理学
物理
核物理学
数学
统计
作者
M. Michaillat,D. Rideau,F. Aniel,C. Tavernier,H. Jaouen
出处
期刊:Journal of physics
[IOP Publishing]
日期:2009-11-01
卷期号:193: 012037-012037
被引量:2
标识
DOI:10.1088/1742-6596/193/1/012037
摘要
High-energy transport properties of charge carriers in ternary random Si1−x−yGexCy alloys are investigated using Full-Band Monte Carlo simulations. Models for scattering mechanisms include phonon scattering, impact ionization and alloy scattering. Phonon scattering rates are wave-vector dependent and calculated consistently with the Full-Band structure. Impact ionization rates are modeled using analytical Keldysh formulas fitted to previously reported ab initio results. We derive a model for alloy scattering rate specific to ternary random alloys. It involves 2 effective alloy potentials which are independently calibrated on experimental mobility measurements. Presented Monte Carlo simulation results are shown to be in very good agreement with a variety of high-energy transport measurements, including drift velocities, impact ionization coefficients and quantum yields. Effects of alloy composition on the electrical characteristics of Si1−x-yGexCy alloys are investigated.
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