威布尔分布
材料科学
GSM演进的增强数据速率
硅
限制
断裂(地质)
点(几何)
复合材料
链接(几何体)
结构工程
计算机科学
数学
光电子学
机械工程
几何学
电信
计算机网络
统计
工程类
作者
Nick Bosco,Martin Springer,Jiqi Liu,Sameera Nalin Venkat,Roger H. French
标识
DOI:10.1109/jphotov.2021.3056673
摘要
Weibull analysis and weakest link theory are employed to resolve the probability of crystalline silicon PV cell fracture when measured as bare cells and when stressed in reduced- and full-sized modules. Experimental results indicated that the characteristic cell strength is reduced by ~20% once packaged into the laminate of a one-cell module and loaded in four-point flexure (4PF). This experimental observation was shown consistent with a weakest link theory prediction that the strength limiting flaws reside on the surface of the cell's edge. The analysis is ultimately extended to present the equivalent loading of four-cell modules by uniform pressure and 4PF and a uniformly loaded full-sized module and demonstrates that smaller, representative, modules must be loaded to a much higher level than their parent full-sized modules to achieve an equivalent probability for cell fracture.
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