双向反射分布函数
旋光法
穆勒微积分
散射
光学
粗糙表面
极化(电化学)
光散射
反射率
菲涅耳方程
曲面(拓扑)
遥感
物理
材料科学
折射率
数学
地质学
几何学
复合材料
化学
物理化学
作者
Richard G. Priest,Steven R. Meier
摘要
We investigate the polarimetric scattering properties of highly absorbing and highly reflective rough surfaces in the IR. We obtain Mueller matrix measurements from these surfaces and compare the data to a Fresnel model. From the data, we determine that a rough, highly absorbing surface has a higher degree of polarization compared to a rough, highly reflective surface. In addition, we present a full polarimetric version of the microfacet model and discuss its properties. This closed-form result for the polarimetric bidirectional reflectance distribution function (BRDF) is derived from the microfacet model.
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