釉
材料科学
陶瓷
基质(水族馆)
平坦度(宇宙学)
复合材料
表面粗糙度
表面光洁度
再结晶(地质)
涂层
薄膜
矿物学
纳米技术
化学
古生物学
地质学
物理
海洋学
生物
量子力学
宇宙学
作者
Jihua Zhang,Shanxue Zhen,Lijun Yang,Feizhi Lou,Hongwei Chen,Chuanren Yang
标识
DOI:10.1143/jjap.50.015803
摘要
The rough surface of ceramic substrate is an obstacle for the scale down of line-width for thin film passive integrated devices (PID). In this paper, a modification method for Al 2 O 3 ceramic substrate with super smooth in surface was proposed. Coating a layer of CaO–Al 2 O 3 –SiO 2 (CAS) glass was performed to flat the rough surface of alumina substrate by sol–gel method. It was found that addition of 0.06% V 2 O 5 can inhibit the recrystallization of the glaze. The root-mean-square (RMS) roughness of the glazed substrates reached a surprising flatness as small as 0.5 nm, and its melting temperature is higher than 1300 °C. This substrate with super flatness and high temperature endurance may be promising for high performance thin film devices.
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