肖特基势垒
材料科学
欧姆接触
单层
凝聚态物理
肖特基二极管
光电子学
金属半导体结
电子结构
电接点
纳米尺度
热电效应
接触电阻
电荷(物理)
异质结
数码产品
金属
纳米技术
半导体
作者
Xiaoying Wan,Baoyi Zhou,Chengqi Zhang,Qingbo Wang,Hai Wang,Jun Liu,Hongxia Zhong
标识
DOI:10.1088/1361-6463/aea99f
摘要
Abstract Driven by the demand for high-performance nanoscale devices, the two-dimensional layered material AlSiTe 3 , featuring tunable electronic structure and excellent thermoelectric and optoelectronic properties, exhibits significant application potential. In this work, we perform first-principles calculations to systematically investigate the interface electronic structure, Schottky barrier height (SBH), and Fermi-level pinning (FLP) of monolayer AlSiTe 3 in contact with metals including Ba, Sc, Eu, Mg, Zr, Pb, Hf, Be, and Ni. The results reveal that metal-induced gap states and interfacial charge transfer strongly influence the electronic properties at the interface. The calculated n- and p-type SBH values indicate pronounced FLP, with pinning factors S n = 0.265 and S p = 0.269 . Moreover, vertical strain, an external electric field, magnetic metals, and layer-number engineering can effectively modulate the contact type and SBH, enabling transitions from Schottky to ohmic contact. These findings provide a theoretical basis for the design of metal contacts in low-power AlSiTe 3 -based electronic devices.
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