钻石
结晶度
表面粗糙度
材料科学
化学工程
基质(水族馆)
人造金刚石
化学键
表面光洁度
金刚石材料性能
纳米技术
分析化学(期刊)
化学
复合材料
有机化学
工程类
地质学
海洋学
作者
Takashi Matsumae,Yuichi Kurashima,Hitoshi Umezawa,Hideki Takagi
标识
DOI:10.7567/1347-4065/ab4c87
摘要
Abstract This study addresses a mechanism by which a diamond surface cleaned with a H 2 SO 4 /H 2 O 2 mixture forms a direct bonding with an oxygen-plasma-activated SiO 2 surface. Surface characterizations revealed that the cleaning with the H 2 SO 4 /H 2 O 2 mixture at 75 °C effectively OH-terminated the diamond (111) surface without a significant increase in the surface roughness. The OH-terminated diamond and SiO 2 /Si substrates formed a C–O–Si bond by thermal dehydration reaction at 200 °C without significant loss in diamond crystallinity. It is expected that the bonding technique using H 2 SO 4 /H 2 O 2 can contribute to the integration between diamond and semiconductor substrates because the high-crystallinity diamond substrate can be directly bonded through the commonly used cleaning processes.
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