折射率
锗
材料科学
拉曼光谱
光学
折射法
色散(光学)
分析化学(期刊)
杂质
谱线
Kramers–Kronig关系
拉曼散射
光谱学
电阻率和电导率
分子物理学
电导率
相干反斯托克斯拉曼光谱
航程(航空)
全内反射
衰减系数
作者
V. A. Lipskiy,V O Nazaryants,Т.V. Kotereva,А. Д. Буланов,В. А. Гавва,В. В. Колташев,М. Ф. Чурбанов,В. Г. Плотниченко
出处
期刊:Applied Optics
[Optica Publishing Group]
日期:2019-09-12
卷期号:58 (27): 7489-7489
被引量:5
摘要
The results of the precise measurement of the refractive index of stable germanium isotopes Ge72, Ge73, Ge74, and Ge76 single crystals with high enrichment and a germanium single-crystal Genat of natural isotopic composition with the Fourier-transform interference refractometry method from 1.94 to 20 μm with 0.1 cm-1 resolution and accuracy of 2×10-5 to 1×10-4 are shown. The content of 72 impurities measured by the mass spectrometric method was below 10-5-10-6 wt. %. Oxygen and carbon concentrations measured by IR spectroscopy in all crystals are within 5×1015 cm-3. All germanium crystals have a hole conductivity with specific electric resistivity of 45-50 Ohm×cm. The coefficients of the generalized Cauchy dispersion function approximating the experimental refractive index values all over the measuring range are given. The transmission and Raman spectra are also given.
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