Reliability and maintainability design of the micro ammeter
作者
Hongliang Chen,Lin Han,Jiaxin Guo,Xingxi Wen
出处
期刊:Journal of physics [IOP Publishing] 日期:2024-11-01卷期号:2897 (1): 012024-012024
标识
DOI:10.1088/1742-6596/2897/1/012024
摘要
Abstract The reliability design and maintainability design of the micro ammeter were made in the paper. Firstly, reliability and maintainability models for the micro ammeter were established, and corresponding predictions and allocations were made. Secondly, this paper developed an analysis tool to improve the efficiency of reliability calculations greatly. Then, three micro ammeters participated in the 612-hour reliability test, and all successfully passed the reliability assessment.