Structure-property correlation and resistive switching mechanism of amorphous and partially crystalline Ta2O5 memristors revealed by in-situ XPS and XAS
作者
Yumin Hu,Ningyi Chen,Pei‐Yu Chuang,Chih‐Ming Lin,Mon‐Shu Ho,Phuoc Huu Le,Shengbin Wu,C. H. Chia,T. C. Han,Sheng‐Rui Jian