沟槽
材料科学
肖特基二极管
光电子学
肖特基势垒
钻石
击穿电压
二极管
金属半导体结
电接点
功勋
电压
电气工程
纳米技术
复合材料
工程类
图层(电子)
作者
Ying Zhu,Wang Lin,Dong‐Shuai Li,Liuan Li,Xianyi Lv,Qiliang Wang,Guangtian Zou
出处
期刊:Chinese Physics B
[IOP Publishing]
日期:2023-03-09
卷期号:32 (8): 088101-088101
被引量:4
标识
DOI:10.1088/1674-1056/acc2ae
摘要
The trench diamond junction barrier Schottky (JBS) diode with a sidewall enhanced structure is designed by Silvaco simulation. Comparing with the conventional trench JBS diode, Schottky contact areas are introduced on the sidewall of the trench beside the top cathode. The sidewall Schottky contact weakens the junction field-effect transistor effect between the trenches to realize a low on-resistance and a high Baliga’s figure of merit (FOM) value. In addition, the existence of the n-type diamond helps to suppress the electric field crowding effect and enhance the reverse breakdown voltage. With the optimal parameters of device structure, a high Baliga’s FOM value of 2.28 GW/cm 2 is designed. Therefore, the proposed sidewall-enhanced trench JBS diode is a promising component for the applications in diamond power electronics.
科研通智能强力驱动
Strongly Powered by AbleSci AI