金属有机气相外延
材料科学
缓冲器(光纤)
氨
质量(理念)
光电子学
流量(数学)
图层(电子)
复合材料
外延
电信
化学
计算机科学
物理
机械
有机化学
量子力学
作者
Karolina Moszak,D. Pucicki,Wojciech Olszewski,Dominika Majchrzak,J. Serafińczuk,D. Hommel
标识
DOI:10.12693/aphyspola.136.589
摘要
The structural properties of AlGaN layers deposited on high-and low-temperature grown AlN buffer were analysed.Modulated ammonia flow method of preparing AlN buffer was compared with a constant ammonia flow process using metalorganic vapour phase epitaxy.Low-temperature growth of the AlN buffer led to an increase of surface roughness, nevertheless crystal quality was comparable to the AlN buffer grown in high-temperature.Low-temperature nucleation AlN on sapphire substrates was required due to differences in thermal expansion and possible reduction of the number of dislocation.Modulated ammonia flow method provides an alternative approach for the AlN buffer growth at reduced reactor temperature.
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