化学机械平面化
抛光
制造工程
计算机科学
过程(计算)
工程类
工艺工程
机械工程
操作系统
作者
Amey S. Kulkarni,Ankur Gupta
出处
期刊:International Journal of Advanced Research in Science, Communication and Technology
[Naksh Solutions]
日期:2022-02-27
卷期号:: 573-609
标识
DOI:10.48175/ijarsct-2592
摘要
Advanced developments and applications of Chemical Mechanical Planarization/Polishing (CMP) did by researchers in current decade were discussed in this article. Topics on which this article forms the basis are Abrasives and slurry developments, environment and safety conditions, manufacturing process improvements, modelling and simulations methods for CMP, optimization approaches, reduction of defects in CMP, aid of other manufacturing processes to improve manufacturing performance of CMP. This article expresses several approaches, methods etc. used by various researchers in past ten years from articles published by reputed publishers (IEEE, SPRINGER, ELSEVIER, SEMANTIC SCHOLAR etc.).
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