Broadband characterization of dielectrics in sub-THz range

In recent years many different methods for dielectric characterization of materials have been developed. However, all methods have some limitations, especially in the sub-terahertz (sub-THz) frequency range. This paper presents a new measurement method, which is based on broadband complex reflection coefficient measurements. The proposed method can be used to characterize every dielectric without accurate information about the thickness of the sample under test. This possibility is useful in case of characterization of some groups of materials (e.g., biological tissues). Furthermore, it is shown, that it is possible to determine electrical properties of two-layer material.