电场
斯塔克效应
氙气
原子物理学
光谱学
激光诱导荧光
度量(数据仓库)
激光器
等离子体
荧光光谱法
材料科学
等离子体诊断
荧光
领域(数学)
里德伯公式
光学
物理
电离
离子
核物理学
数据库
量子力学
纯数学
计算机科学
数学
作者
E. Wagenaars,M. Bowden,G. M. W. Kroesen
出处
期刊:High Temperature Material Processes
日期:2007-01-01
卷期号:11 (3): 455-465
被引量:1
标识
DOI:10.1615/hightempmatproc.v11.i3.120
摘要
The electric field is an important quantity in low-pressure gas discharges, driving many fundamental processes. Unfortunately, it is difficult to measure electric field distributions in plasmas directly. The goal of this research was to develop a diagnostic technique to measure electric fields in low-pressure xenon discharges. It was based on measuring Stark effects in Rydberg levels of xenon atoms by laser-induced fluorescence-dip spectroscopy. With our experimental arrangement we could measure electric fields ranging from 1000 to 4000 V/cm with an accuracy between 150 and 300 V/cm.
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