Dependence of Ion-Implant-Induced LBIC Novel Characteristic on Excitation Intensity for Long-Wavelength HgCdTe-Based Photovoltaic Infrared Detector Pixel Arrays

In this paper, experimental results of laser-irradiance-dependent polarity inversion of laser beam induced current (LBIC) for As-doped long-wavelength HgCdTe pixel arrays grown on CdZnTe are reported. Models for the ion-implant-induced junction transformation are proposed, and demonstrated using numerical simulations. The novel trap-related p-n junction transformation induced by ion implantation is observed under typical laser irradiances for low temperature. The implantation-induced traps and Hg interstitial diffusion are key factors for inducing the LBIC coupling, polarity reversion, and junction broadening at different laser irradiances. The trap type, trap density, and junction configuration are extracted from the measured experiment data. The results provide the near room-temperature HgCdTe photovoltaic detector with a reliable reference on the junction reversion and broadening around implanted regions, as well as controlling the n-on-p junction formation for very long wavelength HgCdTe infrared detector pixels.