钯
铜
金属间化合物
引线键合
材料科学
铜线
冶金
腐蚀
复合材料
催化作用
化学
合金
电气工程
生物化学
炸薯条
工程类
作者
Adeline B.Y. Lim,Andrew Chang,Chee Xian Lee,Oranna Yauw,Bob Chylak,Zhong Chen
出处
期刊:ECS transactions
[Institute of Physics]
日期:2013-03-08
卷期号:52 (1): 717-730
被引量:9
标识
DOI:10.1149/05201.0717ecst
摘要
There is growing interest in copper (Cu) wire bonding due to its significant cost savings over gold wire. However, concerns on corrosion susceptibility and package reliability have driven the industry to develop alternative materials. Recently, palladium-coated copper (PdCu) wire has become widely used as it is believed to improve reliability. In this paper, we experimented with 0.6 mil PdCu and bare Cu wires. Palladium distribution and grain structure of the PdCu Free Air Ball (FAB) were investigated. It was observed that Electronic Flame Off (EFO) current and the cover gas type have a significant effect on palladium distribution. The Free Air Ball (FAB) hardness was measured and correlated to palladium distribution and grain structure. First bond process responses were characterized. The impact of palladium on wire bondability and wire bond intermetallic using a high temperature storage test was studied. These results for PdCu wire were compared with bare Cu wire.
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