角动量
散射
物理
纳米光子学
光散射
干涉测量
高斯光束
光束
极化(电化学)
光学
梁(结构)
量子力学
化学
物理化学
作者
Diptabrata Paul,Deepak K. Sharma,G. V. Pavan Kumar
标识
DOI:10.1002/lpor.202200049
摘要
Abstract In recent times the spin angular momentum (SAM) and orbital angular momentum (OAM) of light have gained prominence because of their significance in optical communication systems, micromanipulation, and sub‐wavelength position sensing. To this end, simultaneous detection of SAM and OAM of light beam is one of the important topics of research from both application and fundamental spin‐orbit interaction (SOI) point of view. While interferometry and metasurface based approaches have been able to detect the states, the presented approach involves elastic scattering from a monocrystalline silver nanowire for the simultaneous detection of SAM and OAM state of a circularly polarized Laguerre–Gaussian beam. By employing Fourier plane (FP) microscopy, the transmitted scattered light intensity distribution in the FP is analyzed to reconstruct the SAM and OAM state unambiguously. The SAM and OAM induced transverse energy flow as well as the polarization dependent scattering characteristics of the nanowire is investigated to understand the detection mechanism. This method is devoid of complex nanofabrication techniques and to the authors' knowledge, is a first example of single nano‐object based simultaneous SAM and OAM detection. The study will further the understanding of SOI effects and can be useful for on‐chip optical detection and manipulation.
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