降级(电信)
钙钛矿(结构)
短路
下降(电信)
材料科学
开路电压
化学物理
光电子学
扩散
氧化物
离子
光致发光
物理
化学
计算机科学
结晶学
电压
电信
热力学
有机化学
冶金
量子力学
作者
Michela Prete,Mark Khenkin,Damian Głowienka,Bhushan Ramesh Patil,Jonas Sandby Lissau,İlker Doğan,J. Lundsgaard Hansen,Till Leißner,Jacek Fiutowski,Horst‐Günter Rubahn,Brian Julsgaard,Péter Balling,Vida Turkovic,Yulia Galagan,Eugene A. Katz,Morten Madsen
标识
DOI:10.1021/acsaem.1c00588
摘要
Degradation of perovskite solar cells (PSCs) is often found to be partially or fully reversible when the cells are allowed to recover in the dark. Unlike the dynamics of degradation, knowledge about the dynamics of PSC cell recovery is very limited. Here, we demonstrate that the PSC recovery strongly depends on the electrical bias conditions during the light-induced degradation and that it can be manipulated by applying an external electrical bias during the recovery phase. Investigation of the recovery dynamics allows us to analyze the degradation mechanisms in detail. More specifically, we aged a mixed-cation mixed-halide PSC with a n-i-p structure under illumination in open-circuit (OC) or short-circuit (SC) conditions, and periodically measured their characteristics during the recovery. PSCs aged in SC degrade faster and fully recover after the light is switched off, while the performance of the cells aged in OC does not recover but instead further decreases after the light is switched off ("drop-in-dark" effect). With the use of transient photoluminescence, secondary ion mass spectrometry, and drift-diffusion-based simulations, we hypothesize that extrinsic ion migration causes the drop-in-dark effect, by forming an electron extraction barrier at the metal oxide electron transport layer. The applied bias alleviates this effect. Our results are relevant for gaining a deeper understanding of the multiple degradation mechanisms present in perovskite solar cells, and for finding a practical way to assist their recovery.
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