纳米孔
氢氟酸
阳极氧化
材料科学
电解质
循环伏安法
蚀刻(微加工)
电解
兴奋剂
电化学
纳米孔
光电子学
半导体
耗尽区
化学工程
分析化学(期刊)
纳米技术
图层(电子)
电极
化学
复合材料
铝
物理化学
冶金
工程类
色谱法
作者
Danti Chen,Hongdi Xiao,Jung Han
摘要
We report the use of hydrofluoric acid (HF) as an electrolyte in etching and porosifying GaN. HF is found to be effective in rendering a wide range of nanoporous morphology, from curved branches to highly parallel straight pores. Under suitable conditions, the porosification proceeds at a rate greater than 100 μm/min. To elucidate the etching mechanism, cyclic voltammetry is performed, together with a parametric mapping of electrolysis variables such as the doping of GaN, the concentration of HF electrolyte, and the anodization voltage. We demonstrate that the formation of nanoporous structures is largely due to the local breakdown of the reverse-biased semiconductor junction. A quantitative agreement between the estimated width of space-charge region and the observed variation in morphology lends support to a depletion layer model developed previously in the etching of porous-Si.
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