外差(诗歌)
超分辨率
本振子
外差探测
光学
模式(计算机接口)
物理
计算机科学
激光器
声学
相位噪声
人工智能
图像(数学)
操作系统
作者
Fan Yang,Arina Tashchilina,E. S. Moiseev,Christoph Simon,A. I. Lvovsky
出处
期刊:Optica
[The Optical Society]
日期:2016-10-17
卷期号:3 (10): 1148-1148
被引量:96
标识
DOI:10.1364/optica.3.001148
摘要
The Rayleigh limit has so far applied to all microscopy techniques that rely on linear optical interaction and detection in the far field. Here we demonstrate that detecting the light emitted by an object in higher-order transverse electromagnetic modes (TEMs) can help in achieving sub-Rayleigh precision for a variety of microscopy-related tasks. Using optical heterodyne detection in TEM01, we measure the position of coherently and incoherently emitting objects to within 0.0015 and 0.012 of the Rayleigh limit, respectively, and determine the distance between two incoherently emitting objects positioned within 0.28 of the Rayleigh limit with a precision of 0.019 of the Rayleigh limit. Heterodyne detection in multiple higher-order TEMs enables full imaging with a resolution significantly below the Rayleigh limit in a way that is reminiscent of quantum tomography of optical states.
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