Resistive switching performance of memristor with solution-processed stacked MO/2D-materials switching layers

In this work, the RRAM device with the structure of Ag/AlOx/MXene/ITO was fabricated with the stacked solution-processed switching layers. The device operated with a low voltage around ~2.0 V and exhibited a stable ON/OFF ratio larger than 10 ⁴ . Apart from excellent stability with endurance cycles of more than 100 and retention time of longer than 10 ⁴ s, typical synaptic behaviors including long-term potentiation and depression (LTP/LTD) were also obtained, which had a positive influence on the following pattern recognition process and the average value of the recognition was around ~90%.