Space-Charge-Limited Current Measurements: A Problematic Technique for Metal Halide Perovskites

Space-charge-limited current (SCLC) measurements play a crucial role in the electrical characterization of semiconductors, particularly for metal halide perovskites. Accurate reporting and analysis of SCLC are essential for gaining meaningful insights into charge transport and defect density in these systems. Unfortunately, performing SCLC measurements on perovskites is complicated by their mixed electronic-ionic conductivity. This complexity led to SCLC data often being incorrectly analyzed using simplified models unsuitable for these materials and reported without essential information about how the measurements were performed. In light of recently published SCLC data, common challenges in using SCLC measurements on perovskite materials are addressed, and solutions are discussed in this paper. The applicability of the often-used analytical models, the overlooked issues related to the mixed ionic-electronic conductivity of perovskites, and the complexity of creating single-carrier devices are investigated using drift-diffusion simulations. Finally, guidelines for more accurate reporting and improved analysis are provided.