Integrated Circuit Characterisation Using Low-Cost Coaxial Probe Measurement

This paper presents a method to characterise integrated circuit (IC) using a low cost coaxial probe. The characteristic impedance of the IC can be used in both time and frequency domain, where it significantly improves the behavioral model of a printed circuit board (PCB) circuitry which is currently being used with limited functionality. S-parameter results obtained from the measurement using the coaxial probe was combined in the simulation model of the PCB which was simulated using three-dimensional (3D) full wave simulation. A comparison between the measurement and simulation results was made and it shows that the measured IC characteristic impedance through the devised low cost probe method produces good correlation up to 1,000 MHz. This study concludes that the feasibility of using the proposed technique for impedance characterisation of IC to be included into the PCB circuitry would provide a better understanding of signal and power integrity, and electromagnetic compatibility (EMC).