X射线光电子能谱
钨
谱线
X射线吸收光谱法
价(化学)
吸收光谱法
电子结构
费米能级
化学
分析化学(期刊)
电子能带结构
结合能
带隙
材料科学
原子物理学
核磁共振
物理
凝聚态物理
计算化学
光学
光电子学
有机化学
量子力学
天文
色谱法
电子
标识
DOI:10.1016/s0925-8388(00)00697-6
摘要
X-ray photoelectron (XPS), emission (XES), and absorption (XAS) spectroscopy methods were used to study the electronic structure of WOx compounds over the range 2.0≤x≤3.0. The XPS core-level binding energies (BEs) and valence-band structures for the tungsten oxides were determined. The XES O Kα and XAS W LIII spectra for the compounds were derived. It was established that the XPS O 2s-like sub-band intensity decreases almost monotonously when going from WO3 to WO2. In all the studied tungsten oxides the energy positions of the centers of gravity of the O 2p-like emission bands remain constant. Half-widths of both the XPS W 4f and O 1s core-level spectra increase in the sequence WO3→WO2. The creation of a sub-band of M–M interactions with a two-peak structure in the near-Fermi region of the XPS valence-band spectra was observed for WOx, where 2.0≤x≤2.77. The sub-band intensity increased significantly in the sequence WO2.77→WO2.3→WO2. The XPS O 1s core-level BEs remain constant (within experimental error) for all the tungsten oxides studied. Both the O Kα band and the XPS valence-band spectra broaden somewhat in the sequence WO3→WO2. The inflection point of the W LIII absorption spectra shifted almost monotonously towards higher energies when going from WO2 to WO3.
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