A Wide Dynamic-Range CMOS Image Sensor Using Self-Reset Technique
作者
Dong-Won Park,Jehyuk Rhee,Young Hoon Joo
出处
期刊:IEEE Electron Device Letters [Institute of Electrical and Electronics Engineers] 日期:2007-09-24卷期号:28 (10): 890-892被引量:45
标识
DOI:10.1109/led.2007.905396
摘要
A wide dynamic-range (DR) pixel-level CMOS image sensor with self-reset technique has been fabricated using a 0.18-mum six-metal CMOS technology and tested to verify simultaneous increase of both DR and peak signal-to-noise ratio (SNR). It provides a continuous peak SNR enhancement over a strong incident light range. Maximum achievable DR is measured over 71.1 dB, and SNR keeps increasing at 7.3 dB/decade beyond conventional CMOS image sensors.