Bi N V bond: A hole-transfer bridge for high-efficient separation and transfer of carriers

X射线光电子能谱 离解(化学) 材料科学 退火(玻璃) 动力学 氮化物 纳米技术 化学工程 化学 复合材料 物理化学 图层(电子) 量子力学 物理 工程类
作者
Yuhong Wang,Wenjun Jiang,Wei Yao,Zailun Liu,Zhe Liu,Yajun Wang,Lijie Shi,Lizhen Gao
出处
期刊:Journal of Colloid and Interface Science [Elsevier BV]
卷期号:590: 144-153 被引量:11
标识
DOI:10.1016/j.jcis.2021.01.043
摘要

Bi N V bond was formed between C x N y and BiVO 4 , which served as a hole-transfer bridge to prominently accelerate holes transfer driven by the interfacial electric field. The photocurrent of C x N y /BiVO 4 photoanode reached 1.5 mA/cm 2 at 0.6 V RHE . The photocurrent of C x N y /BiVO 4 photoanode remained 83.3% of the initial photocurrent after 10 h at 1.23 V RHE . • The photocurrent density of C x N y /BiVO 4 photoanode reached 1.5 mA/cm 2 at a low bias voltage of 0.6 V RHE . • The ABPE of C x N y /BiVO 4 photoanode achieved 0.97%. • The photocurrent density of CxNy/BiVO4 photoanode remained 83.3% after 10 h at 1.23 V RHE . • Bi N V bond can significantly accelerate holes transfer and change the coordination environment of metal ions. Addressing the inherent holes transport limitation of BiVO 4 photoanode is crucial to achieve efficient photoelectrochemical (PEC) water splitting. The construction of the hole-transfer bridge between co-catalysts and BiVO 4 photoanode could be an effective way to overcome sluggish hole-transfer kinetics of BiVO 4 photoanode. Herein, C x N y /BiVO 4 photoanode was prepared by coupling carbon nitride hydrogel (CNH) containing unsaturated N on the BiVO 4 photoanode during annealing. C x N y /BiVO 4 photoanode exhibited excellent PEC performance and stability. Photoelectrochemical tests proved that the coupling of C x N y accelerated holes transfer and enhanced oxygen evolution kinetics. X-ray photoelectron spectroscopy (XPS) and theoretical calculations confirmed the existence of the Bi N V bond between BiVO 4 photoanode and C x N y , which could serve as the hole-transfer bridge to significantly accelerate separation and transfer of carriers driven by the interfacial electric field. Moreover, it was found that the coupling of C x N y effectively inhibited the dissociation of metal ions through changing their coordination environment, resulting in the excellent stability of C x N y /BiVO 4 photoanode. This result provides unique insights into vital roles of the interfacial structure, which might have a significant impact on the construction of PEC devices.
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