Preparation of X5R type Ni-MLCCs and capacitance response to combined out-field variations

With the continuous development of electronic devices, miniaturization and high capacitance have become important factors in the fabrication of multilayer ceramic capacitors (MLCCs) with a Ni internal electrode (Ni-MLCCs). The typical thickness of the dielectric layer of commercial MLCCs is less than 1 μm, which implies a higher capacitance compared to MLCCs with a thicker dielectric layer. In this study, 1210-type Ni-MLCCs were prepared via a tape casting method using a BaTiO3 powder chemically coated with Dy and Ho additives. The high capacitance (390 nF) Ni-MLCC sintered at 1220 °C exhibited a low dielectric loss (tan δ < 2%), high insulation resistance (>9000 MΩ), and temperature stability comparable to that of the EIA X5R standard (capacitance-temperature coefficient (TCC) = ΔC/C25 °C ≤ ±15%, between -55–85 °C). Relaxation behavior was observed between 1 Hz and 10 kHz, following the modified Curie–Weiss law and the Vogel–Fulcher relationship. The capacitive temperature stability of Ni-MLCC is closely related to the applied direct current (DC) bias field. The EIA X7R stability (TCC ≤ ±15%, between -55–125 °C) of the Ni-MLCCs at 1220 °C was gained under dc-bias field 3 and 5 V/μm. The capacitance varied as alternating current (AC) electric fields were applied. The grain shell was sensitive to both the DC bias and AC fields, but the grain core was more sensitive to the DC bias electrical field than the AC field. Furthermore, the ferroelectric response in MLCC decreases with rising temperature.