贝叶斯优化
激光打孔
材料科学
贝叶斯网络
计算机科学
优化算法
贝叶斯概率
算法
激光器
人工智能
钻探
数学优化
数学
光学
物理
冶金
作者
Yuhang Ouyang,Dongyang Hou,Ting Lv,Fang Dong,Sheng Liu,Jianhui Zhao
出处
期刊:IEEE Transactions on Components, Packaging and Manufacturing Technology
[Institute of Electrical and Electronics Engineers]
日期:2024-08-20
卷期号:14 (9): 1680-1691
被引量:5
标识
DOI:10.1109/tcpmt.2024.3446510
摘要
In the semiconductor industry, especially in the manufacturing of through-glass vias (TGVs), there is an increasing need to improve the quality and efficiency of manufacturing processes. To address the challenges such as lack of efficiency, requiring substantial manual labor, and falling short in precision of traditional methods in meeting high standards for TGV manufacturing, the approach that combines deep learning and optimization techniques was introduced to achieve automatic quality assessment and refine laser drilling parameters for TGVs manufacturing. We have developed a residual U-Net model with an accuracy of up to 87.9% by training high-resolution scanning electron microscope (SEM) images of TGVs for automatic assessment of TGVs quality, closely matching the assessments made by human experts. We used Bayesian optimization to iteratively adjust the laser drilling parameters that are crucial for TGVs manufacturing, and the quality scores obtained by the residual U-Net model enhanced by 13.2% after 50 iterations, which confirms the effectiveness of the integration of U-Net architecture with Bayesian optimization in achieving optimal manufacturing results.
科研通智能强力驱动
Strongly Powered by AbleSci AI