触针
显微镜
共焦
光学
数字显微镜
表面粗糙度
表面光洁度
校准
材料科学
测量仪器
计量学
共焦激光扫描显微镜
计算机科学
计算机视觉
数学
物理
复合材料
统计
热力学
作者
Alberto Mínguez-Martínez,Piera Maresca,Jesús Caja,J. de Vicente
出处
期刊:Materials
[Multidisciplinary Digital Publishing Institute]
日期:2022-08-10
卷期号:15 (16): 5495-5495
被引量:26
摘要
This article presents the results of an LMM-R-2019 interlaboratory comparison. Such comparisons of different families of measuring instruments are one of the activities conducted among the calibration laboratories to maintain their ISO 17025 accreditation. Given that the study of surface roughness is becoming increasingly important in the field of dimensional metrology, the comparison focused on determining the Ra parameter on a pseudorandom metallic roughness standard using two types of measuring instruments: physical contact (stylus instruments) and optical (confocal microscopes). Among the aspects studied was whether the roughness measurements obtained using calibrated confocal microscopes could be compared with those using traditional methods since optical instruments obtain measurements more quickly and responsively than do stylus instruments. The results showed that roughness measurements using confocal microscopes are comparable with those from a traditional stylus instrument.
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