Pattern Optimization for 3D Surface Reconstruction with an Active Line Scan Camera System

The 3d surface reconstruction with active line-scan camera systems generally require a special approach for generating powerful structured light. For our system, we use a structured light approach based on distributed projection of a LED line light. The pattern generated by this kind of structured light are extremely height dependent and provide an inhomogeneous measurement accuracy. Thus, it is necessary to determine pattern sequences providing precise 3d measurements over the whole measuring range. For this we first define average-free pattern sequences, which can be normalized and evaluated in terms of their local correlation properties. Based on that definition we propose a heuristic algorithm to choose optimal pattern sequences and verify its basic functionality.