钝化
紫外线
材料科学
降级(电信)
辐照
光电子学
聚合物
共发射极
开路电压
纳米技术
电压
复合材料
电气工程
图层(电子)
物理
核物理学
工程类
作者
Robert Witteck,Boris Veith‐Wolf,Henning Schulte‐Huxel,Arnaud Morlier,Malte Ruben Vogt,Marc Köntges,Rolf Brendel
摘要
In this paper, we report on the stability of p-type passivated emitter and rear cells under ultraviolet (UV) exposure with various silicone nitride passivation coatings and embedded in different encapsulation polymers. Our results reveal that UV transparent polymers can result in a module power loss of up to 6% under a UV irradiation dose of 497 kWh/m2. We show that the degradation in power is caused by a reduction in open circuit voltage. This loss is related to an increased recombination in the cell, which we ascribe to a degradation of the surface passivation. With ray tracing simulations, we determine the number of photons reaching the passivation interface. Assuming that all photons with energies above 3.5 eV de-passivate the interface is in agreement with our experimental results. Copyright © 2017 John Wiley & Sons, Ltd.
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