MOSFET
电磁干扰
碳化硅
转身(生物化学)
电气工程
炸薯条
电子工程
计算机科学
电压
材料科学
工程类
电磁干扰
物理
晶体管
核磁共振
冶金
作者
Jianwen Cao,Zekun Zhou,Yue Shi,Bo Zhang
出处
期刊:IEEE Transactions on Circuits and Systems Ii-express Briefs
[Institute of Electrical and Electronics Engineers]
日期:2022-10-11
卷期号:70 (2): 660-664
被引量:7
标识
DOI:10.1109/tcsii.2022.3213556
摘要
Silicon carbide (SiC) MOSFET has significant advantages in high-voltage (HV) and high-frequency (HF) applications due to its electrical characteristics. In order to make use of its merits, the active driver is necessary for SiC MOSFET. During the turn-off operation of SiC MOSFET, it is critical to prevent the channel current from disappearing prematurely, which has not been addressed in existing active drivers. This brief proposes an on-chip active turn-off driver to realize the fast turn-off speed and low EMI noises. The mechanism is that the turn-off driving current needs to be adjusted rapidly according to the operating state of SiC MOSFET, which can also ensure that EMI noises and overshoots are under control. Then, the proposed turn-off driver is fabricated in a $0.18~\mu \text{m}$ BCD process and occupies a 0.99mm2 active area. Finally, using the proposed active turn-off driver, the turn-off operation of SiC MOSFET has experimented with the 15A and 90A load current, respectively. SiC MOSFET realizes a high turn-off performance, about 200ns turn-off time with low EMI noises, demonstrating that the proposed on-chip active turn-off driving technique is suitable for SiC MOSFET under different loads.
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