Realization of ultra-small stress birefringence detection with weak-value amplification technique

How to realize the detection of tiny birefringence is an important but challenging issue for investigations and applications in optics. In weak measurements, weak-value amplification has been widely applied to the precise estimation of time delay. Here, we show that the linear amplification in weak measurements has the potential to outperform standard weak-value amplification for ultra-small parameter characterization. The higher measurement accuracy in the linear amplification enables us to achieve a measurement of stress-induced birefringence with a high resolution of 5×10−10. Compared with existing methods, the accuracy based on weak measurements for birefringence detection can improve two orders of magnitude. Our method may have important applications in a variety of fields involving the precise measurement of time delay or birefringence.