Deep oxide trench termination structure for super-junction MOSFET
作者
Run-yan Miao,Fang Lu,Yanying Wang,Da-wei Gong
出处
期刊:Electronics Letters [Institution of Engineering and Technology] 日期:2012-08-02卷期号:48 (16): 1018-1019被引量:12
标识
DOI:10.1049/el.2012.2061
摘要
Deep oxide trench isolation with a p-type pillar guard is suggested as the termination structure for a high voltage super-junction (SJ) MOSFET device. With an additional p-type pillar guard, such a structure can result in a trapezoidal field profile in depth along the oxide trench sidewall and the device has improved breakdown voltage limited by an intrinsic super-junction structure.