堆积
角分辨光电子能谱
石墨烯
材料科学
电子结构
光电发射光谱学
凝聚态物理
电子能带结构
纳米尺度
带隙
光谱学
X射线光电子能谱
纳米技术
光电子学
化学物理
化学
核磁共振
物理
量子力学
作者
Changhua Bao,Wei Yao,Eryin Wang,Kai Chen,J. Ávila,M. C. Asensio,Shuyun Zhou
出处
期刊:Nano Letters
[American Chemical Society]
日期:2017-02-22
卷期号:17 (3): 1564-1568
被引量:107
标识
DOI:10.1021/acs.nanolett.6b04698
摘要
The crystallographic stacking order in multilayer graphene plays an important role in determining its electronic structure. In trilayer graphene, rhombohedral stacking (ABC) is particularly intriguing, exhibiting a flat band with an electric-field tunable band gap. Such electronic structure is distinct from simple hexagonal stacking (AAA) or typical Bernal stacking (ABA) and is promising for nanoscale electronics and optoelectronics applications. So far clean experimental electronic spectra on the first two stackings are missing because the samples are usually too small in size (μm or nm scale) to be resolved by conventional angle-resolved photoemission spectroscopy (ARPES). Here, by using ARPES with a nanospot beam size (NanoARPES), we provide direct experimental evidence for the coexistence of three different stackings of trilayer graphene and reveal their distinctive electronic structures directly. By fitting the experimental data, we provide important experimental band parameters for describing the electronic structure of trilayer graphene with different stackings.
科研通智能强力驱动
Strongly Powered by AbleSci AI