X射线光电子能谱
图书馆学
艺术史
分析化学(期刊)
工程类
艺术
化学
计算机科学
化学工程
环境化学
标识
DOI:10.1002/sia.740060611
摘要
Surface and Interface AnalysisVolume 6, Issue 6 p. 302-302 Book Review Practical surface analysis by Auger and X-ray photoelectron spectroscopy. D. Briggs and M. P. Seah (Editors). John Wiley and Sons Ltd, Chichester, 1983, 533 pp., £44.50 J. E. Castle, J. E. Castle Dept. of Metallurgy and Materials Science, University of Surrey, GuildfordSearch for more papers by this author J. E. Castle, J. E. Castle Dept. of Metallurgy and Materials Science, University of Surrey, GuildfordSearch for more papers by this author First published: December 1984 https://doi.org/10.1002/sia.740060611Citations: 28AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article.Citing Literature Volume6, Issue6December 1984Pages 302-302 RelatedInformation
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