小角X射线散射
材料科学
准直光
探测器
散射
表征(材料科学)
光学
纳米材料
纳米技术
激光器
物理
作者
Olivier Taché,Stéphan Rouzière,Philippe Joly,Mohamed Amara,Blaise Fleury,Antoine Thill,Pascale Launois,Olivier Spalla,Benjamin Abécassis
标识
DOI:10.1107/s1600576716012127
摘要
This article presents the technical characteristics of a newly built small- and wide-angle X-ray scattering (SAXS/WAXS) apparatus dedicated to structural characterization of a wide range of nanomaterials in the powder or dispersion form. The instrument is based on a high-flux rotating anode generator with a molybdenum target, enabling the assessment of highly absorbing samples containing heavy elements. The SAXS part is composed of a collimation system including a multilayer optic and scatterless slits, a motorized sample holder, a vacuum chamber, and a two-dimensional image-plate detector. All the control command is done through a TANGO interface. Normalization and data correction yield scattering patterns at the absolute scale automatically with a q range from 0.03 to 3.2 Å −1 . The WAXS part features a multilayer collimating optic and a two-dimensional image-plate detector with variable sample-to-detector distances. The accessible q range is 0.4–9 Å −1 , ensuring a large overlap in q range between the two instruments. A few examples of applications are also presented, namely coupled SAXS/WAXS structure and symmetry determination of gold nanocrystals in solution and characterization of imogolite nanotubes and iron-filled carbon nanotube samples.
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