期刊:RSC Advances [Royal Society of Chemistry] 日期:2015-01-01卷期号:5 (37): 29153-29158被引量:11
标识
DOI:10.1039/c5ra04088d
摘要
The effect of Al evaporation temperature on the properties of Al films grown on sapphire substrates by molecular beam epitaxy has been studied in detail.