反射(计算机编程)
电介质
入射(几何)
最大值和最小值
马克西玛
光学
全内反射
胆甾液晶
光谱(功能分析)
入射角(光学)
液晶
平面(几何)
共振(粒子物理)
Crystal(编程语言)
材料科学
反射率
凝聚态物理
物理
几何学
数学
数学分析
原子物理学
量子力学
光电子学
艺术
艺术史
计算机科学
程序设计语言
表演艺术
作者
R. Dreher,G. Meier,Alfred Saupe
出处
期刊:Molecular crystals and liquid crystals
日期:1971-04-01
卷期号:13 (1): 17-26
被引量:124
标识
DOI:10.1080/15421407108083534
摘要
Selective light reflection at the plane structure of a cholesteric liquid crystal is treated by the theory of de Vries(1) for normal incidence only. A more general approach is outlined for arbitrary angles of incidence. Conditions for the borders of the reflection bands are given. Also the cases of ordinary total reflection are included. Using the derived formula, the two principal dielectric constants are determined from the angles of total reflection measured with a refrectometer. Their values are used to calculate ther eflection spectrum of a layer of finite thickness at normal incidence which is compared with an experimental spectrum. In agreement with the experimental curve the calculated spectrum shows a central band with a nearly rectangular shape flanked by a series of maxima and minima due to interferences, the positions of which depend strongly on the dielectric constants.
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