折射率
介电函数
电介质
光子能量
谱线
衰减系数
入射角(光学)
椭圆偏振法
航程(航空)
分析化学(期刊)
吸收(声学)
材料科学
临界点(数学)
反射率
光学
化学
光子
物理
薄膜
光电子学
数学
几何学
纳米技术
量子力学
色谱法
复合材料
作者
Norihiro Suzuki,Sadao Adachi
摘要
The real ( ε 1 ) and imaginary ( ε 2 ) parts of the complex dielectric function, ε ( E )= ε 1 ( E )+ i ε 2 ( E ), of SnTe have been measured by spectroscopic ellipsometry (SE) in the 1.15-5.5 eV photon-energy range at room temperature. The measured SE spectra reveal distinct structures at energies of E 1 , E 2 and E 3 critical points. These data are analyzed using two theoretical models, namely, the model dielectric function (MDF) and standard critical-point (SCP) model. It is found that both the MDF and SCP models successfully explain the first-derivative spectra of ε ( E ) [ d ε ( E )/ d E ]. The MDF also shows excellent agreement with the experimental ε ( E ) spectra, but the SCP does not. Dielectric-related optical constants, such as the complex refractive index ( n * = n + i k ), absorption coefficient (α) and normal-incidence reflectivity ( R ), of SnTe are also presented.
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