异质结双极晶体管
比克莫斯
硅锗
缩放比例
计算机科学
材料科学
电气工程
光电子学
晶体管
工程类
硅
双极结晶体管
数学
电压
几何学
作者
S.D. Phillips,Edward Preisler,J. Zheng,Samir Chaudhry,M. Racanelli,Markus A. Müller,M. Schröter,Warren McArthur,David J J. Howard
出处
期刊:
日期:2021-12-05
卷期号:: 1-5
被引量:17
标识
DOI:10.1109/bcicts50416.2021.9682485
摘要
A new generation of Tower Semiconductor's SBC18 SiGe BiCMOS process family is introduced, SBC18H5, that features a baseline high-speed SiGe HBT with a peak fTof 285 GHz and a peak fMAXof 310 GHz. The process enhancements necessary to improve the HBT from the previous technology node are described as well as the accompanying mm-wave components that are complementary for front-end module design. A detailed TCAD analysis of the 1D vertical profile highlights additional opportunities to enhance the high-frequency performance of the SiGe HBTs without altering the existing integration. Base epitaxial experimentation based on these simulated changes results in increasing the fTto 330 GHz and the fMAXto 345 GHz. This process enhancement has been released as a stand-alone process, SBC18EH5, which combines the core component offering of SBC18H5 with the vertical profile optimized SiGe HBTs. Pushing the limits of lateral scaling based on extended 200 mm wafer lithography capability, a measured fT/fMAXof 350/500 GHz is achieved and will be released as a new stand-alone sixth generation process named SBC18H6.
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