In-plane Optical Anisotropy in ZrTe5 Single Crystal Revealed by Spectroscopic Mueller Ellipsometer
单晶
各向异性
椭圆偏振法
材料科学
光学
光电子学
物理
核磁共振
纳米技术
薄膜
作者
Zhengfeng Guo,Honggang Gu,Shiyuan Liu
标识
DOI：10.1364/isst.2019.jw4a.94
摘要
The in-plane optical constant (the extinction coefficient k and the refractive index n) of ZrTe5 single crystal was measured by spectroscopic Mueller ellipsometer, which show great in-plane optical anisotropy.
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(2025-6-4)
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