饱和(图论)
可见的
物理
晶体管
阈值电压
场效应晶体管
符号
光电子学
凝聚态物理
电压
量子力学
电气工程
材料科学
数学
组合数学
算术
工程类
作者
Z. Gao,Carlo De Santi,Fabiana Rampazzo,Marco Saro,Mirko Fornasier,Gaudenzio Meneghesso,Matteo Meneghini,Alessandro Chini,G. Verzellesi,Enrico Zanoni
标识
DOI:10.1109/ted.2023.3326781
摘要
The kink effect in field-effect transistors (FETs) consists in a sudden increase in drain current, I-D, during a drain voltage sweep and leading to a higher I-D saturation value. We report new experimental data concerning the dynamic behavior of the "kink" in AlGaN/GaN HEMTs and correlate them with deep levels. The results demonstrate the role of the Poole-Frenkel effect in determining the occurrence of the kink and identify the experimental conditions that make it observable.
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