光学
光学相干层析成像
材料科学
无损检测
蚀刻(微加工)
光路
图像分辨率
断层摄影术
图像处理
计算机科学
物理
复合材料
图像(数学)
计算机视觉
量子力学
图层(电子)
作者
Samson Frank,Michael Seiler,Jens Bliedtner
出处
期刊:Applied Optics
[Optica Publishing Group]
日期:2021-01-28
卷期号:60 (8): 2118-2118
被引量:28
摘要
Subsurface damage (SSD) induced during conventional manufacturing of optics contributes mainly to a reduction in the performance and quality of optics. In this paper, we propose the application of full-field optical coherence tomography (FF-OCT) as a high-resolution and nondestructive method for evaluation of SSD in optical substrates. Both ground and polished surfaces can be successfully imaged, providing a path to control SSD throughout the entire optics manufacturing process chain. Full tomograms are acquired for qualitative and quantitative analyses of both surface and SSD. The main requirements for the detection of SSD are addressed. Data processing allows the removal of low-intensity image errors and the automatic evaluation of SSD depths. OCT scans are carried out on destructively referenced glass samples and compared to existing predictive models, validating the obtained results. Finally, intensity projection methods and depth maps are applied to characterize crack morphologies. The experiments highlight differences in crack characteristics between optical glasses SF6 and HPFS7980 and illustrate that wet etching can enhance three-dimensional imaging of SSD with FF-OCT.
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