氧化铟锡
电阻随机存取存储器
光电子学
电阻式触摸屏
材料科学
横杆开关
化学
计算机科学
纳米技术
电极
电气工程
薄膜
电信
物理化学
工程类
作者
Surajit Sarkar,Farhana Yasmin Rahman,Hritinava Banik,Swapan Majumdar,Debajyoti Bhattacharjee,Syed Arshad Hussain
出处
期刊:Langmuir
[American Chemical Society]
日期:2022-07-21
卷期号:38 (30): 9229-9238
被引量:7
标识
DOI:10.1021/acs.langmuir.2c01011
摘要
Complementary resistive switching (CRS) devices are more advantageous compared to bipolar resistive switching (BRS) devices for memory applications as they can minimize the sneak path problem observed in the case of BRS having a crossbar array structure. Here, we report the CRS behavior of 1,4-bis(di(1H-indol-3-yl)methyl)benzene (Indole1) molecules. Our earlier study revealed that Au/Indole1/Indium tin oxide (ITO) devices showed BRS under ambient conditions. However, the present investigations revealed that when the device is exposed to 353 K or higher temperatures, dynamic evolution of the Au/Indole1/ITO device from BRS to CRS occurred with a very good memory window (∼103), data retention (5.1 × 103 s), stability (50 days), and device yield (∼ 60%). This work explores the application possibility of indole derivatives toward future ultradense resistive random access memory.
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